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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    Inside the aberration corrector (hexapole -hexapole type) A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen.

  4. Scanning tunneling microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling_microscope

    A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. [1][2][3] STM senses the surface by using an extremely sharp conducting tip that can ...

  5. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    Electron microscope. An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing them to produce magnified images or electron diffraction patterns.

  6. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted ...

  7. Ultrafast scanning electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Ultrafast_scanning...

    The setup simply consists of scanning electron microscopy machine always works in ultra-high vacuum that regarding on electron beam as a probe and ultrashort laser beam as pump. [12] Firstly, Schottky emission gun is almost common to use as source of primary beam due to high beam brightness after passing through electromagnetic lens.

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