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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) gathers information by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning.
Atomic force microscope inside a FTIR spectrometer with the optical interface. The earliest measurements combining AFM with infrared spectroscopy were performed in 1999 by Hammiche et al. at the University of Lancaster in the United Kingdom, [1] in an EPSRC-funded project led by M Reading and H M Pollock.
1967: Erwin Wilhelm Müller adds time-of-flight spectroscopy to the field ion microscope, making the first atom probe and allowing the chemical identification of each individual atom. 1981: Gerd Binnig and Heinrich Rohrer develop the scanning tunneling microscope (STM). 1986: Gerd Binnig, Quate, and Gerber invent the atomic force microscope (AFM).
[14] [15] [2] The Scanning Tunneling Microscope is used mostly for morphological topological investigation of a clean conductive sample, because it is able to give an image of its surface with atomic resolution. The Atomic Force Microscope is a powerful tool in order to study tribology at a fundamental level.
In 1985, Binnig invented the atomic force microscope (AFM) [6] and Binnig, Christoph Gerber and Calvin Quate went on to develop a working version of this new microscope for insulating surfaces. [7] In 1987 Binnig was appointed IBM Fellow. In the same year, he started the IBM Physics group Munich, working on creativity [8] and atomic force ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...
They published six papers together from 1926 to 1928, dealing with the forces between atoms and ions, that were to become the foundation of her master's thesis. Later work has shown that the results they obtained had direct application to atomic force microscopy by predicting that non-contact imaging is possible only at small tip-sample ...