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Software reliability is the probability that software will work properly in a specified environment and for a given amount of time. Using the following formula, the probability of failure is calculated by testing a sample of all available input states.
highly accelerated stress test is a Ongoing Reliability Test that uses the empirical operational limits as the reference for the combined vibration, thermal cycling, and other stress applied to find latent defects. Quality of the products is then measured with the results of this test.
HALT is a test technique called test-to-fail, where a product is tested until failure. HALT does not help to determine or demonstrate the reliability value or failure probability in field. Many accelerated life tests are test-to-pass, meaning they are used to demonstrate the product life or reliability.
Test coverage in the test plan states what requirements will be verified during what stages of the product life. Test coverage is derived from design specifications and other requirements, such as safety standards or regulatory codes, where each requirement or specification of the design ideally will have one or more corresponding means of verification.
Reliability engineering is a sub-discipline of systems engineering that emphasizes the ability of equipment to function without failure. Reliability is defined as the probability that a product, system, or service will perform its intended function adequately for a specified period of time, OR will operate in a defined environment without failure. [1]
The test plan could come in the form of a single plan that includes all test types (like an acceptance or system test plan) and planning considerations, or it may be issued as a master test plan that provides an overview of more than one detailed test plan (a plan of a plan). [51] A test plan can be, in some cases, part of a wide "test strategy ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
Accelerated life testing is the process of testing a product by subjecting it to conditions (stress, strain, temperatures, voltage, vibration rate, pressure etc.) in excess of its normal service parameters in an effort to uncover faults and potential modes of failure in a short amount of time.
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