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ICS basic organization chart (ICS-100 level depicted) The Incident Command System (ICS) is a standardized approach to the command, control, and coordination of emergency response providing a common hierarchy within which responders from multiple agencies can be effective.
Cognitive pretesting, or cognitive interviewing, is a field research method where data is collected on how the subject answers interview questions. It is the evaluation of a test or questionnaire before it's administered. [1]
The National Incident Management System (NIMS) is a standardized approach to incident management developed by the United States Department of Homeland Security.The program was established in March 2004, [1] in response to Homeland Security Presidential Directive-5, [1] [2] issued by President George W. Bush.
In the United States, the hospital incident command system (HICS) is an incident command system (ICS) designed for hospitals and intended for use in both emergency and non-emergency situations. It provides hospitals of all sizes with tools needed to advance their emergency preparedness and response capability—both individually and as members ...
In wildland fire suppression in the United States, S-130/S-190 refers to the basic wildland fire training course required of all firefighters before they can work on the firelines.
Developed and maintained by the International Organization for Standardization, the ICS is intended to be a continuous work in progress and is updated when necessary. The latest edition of the ICS can be downloaded free of charge from the ISO web site. Anyone may submit a proposal for modifications or additions to the ICS.
An industrial control system (ICS) is an electronic control system and associated instrumentation used for industrial process control.Control systems can range in size from a few modular panel-mounted controllers to large interconnected and interactive distributed control systems (DCSs) with many thousands of field connections.
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.