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The Patterson function is used to solve the phase problem in X-ray crystallography. It was introduced in 1935 by Arthur Lindo Patterson while he was a visiting researcher in the laboratory of Bertram Eugene Warren at MIT. [1] [2] The Patterson function is defined as
In physics, the phase problem is the problem of loss of information concerning the phase that can occur when making a physical measurement. The name comes from the field of X-ray crystallography , where the phase problem has to be solved for the determination of a structure from diffraction data. [ 1 ]
In X-ray imaging, the acquired projection images generally suffer from fixed-pattern noise, which is one of the limiting factors of image quality. It may stem from beam inhomogeneity, gain variations of the detector response due to inhomogeneities in the photon conversion yield, losses in charge transport, charge trapping, or variations in the ...
X-ray absorption (left) and differential phase-contrast (right) image of an in-ear headphone obtained with a grating interferometer at 60kVp. Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images.
Single-wavelength anomalous diffraction (SAD) is a technique used in X-ray crystallography that facilitates the determination of the structure of proteins or other biological macromolecules by allowing the solution of the phase problem.
Multi-wavelength anomalous diffraction (sometimes Multi-wavelength anomalous dispersion; abbreviated MAD) is a technique used in X-ray crystallography that facilitates the determination of the three-dimensional structure of biological macromolecules (e.g. DNA, drug receptors) via solution of the phase problem.
Dark-field X-ray microscopy (DFXM [1] or DFXRM [2]) is an imaging technique used for multiscale structural characterisation. It is capable of mapping deeply embedded structural elements with nm-resolution using synchrotron X-ray diffraction -based imaging.
Single-shot multi-contrast x-ray imaging is an efficient and a robust x-ray imaging technique which is used to obtain three different and complementary types of information, i.e. absorption, scattering, and phase contrast from a single exposure of x-rays on a detector subsequently utilizing Fourier analysis/technique.