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The Williams diagram is universal in the sense that it is applicable to both premixed and non-premixed combustion. In supersonic combustion and detonations , the diagram becomes three-dimensional due to the addition of the Mach number M a = u ′ / c {\displaystyle Ma=u'/c} as the z-axis, where c {\displaystyle c} is the sound speed .
Michigan O probe with Williams markings (left) and Naber's probe with shades alternating every 3 mm (right). Proper use of the periodontal probe is necessary to maintain accuracy. The tip of the instrument is placed with light pressure of 10-20 grams [ 1 ] into the gingival sulcus , which is an area of potential space between a tooth and the ...
A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom .
Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
A molecular probe is a group of atoms or molecules used in molecular biology or chemistry to study the properties of other molecules or structures. If some measurable property of the molecular probe used changes when it interacts with the analyte (such as a change in absorbance ), the interactions between the probe and the analyte can be studied.
Larger-diameter platinum wire is used, which drives up the cost and results in a lower resistance for the probe (typically 25.5 Ω). UPRTs have a wide temperature range (−200 °C to 1000 °C) and are approximately accurate to ±0.001 °C over the temperature range. UPRTs are only appropriate for laboratory use.
Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.
Another use for microprobes is the production of micro and nano sized devices, as in microelectromechanical systems and nanoelectromechanical systems. [6] The advantage that microprobes have over other lithography processes is that a microprobe beam can be scanned or directed over any area of the sample. This scanning of the microprobe beam can ...