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  2. IPS panel - Wikipedia

    en.wikipedia.org/wiki/IPS_panel

    The True depth method was the only viable technology for active matrix TFT LCDs in the late 1980s and early 1990s. Early panels showed grayscale inversion from up to down, [ 2 ] and had a high response time (for this kind of transition, 1 ms is visually better than 5 ms).

  3. Inverse photoemission spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Inverse_photoemission...

    Due to the low energy of the incident electrons, their penetration depth is only a few atomic layers, making inverse photoemission a particularly surface sensitive technique. As inverse photoemission probes the electronic states above the Fermi level of the system, it is a complementary technique to photoemission spectroscopy .

  4. Ion beam analysis - Wikipedia

    en.wikipedia.org/wiki/Ion_beam_analysis

    At the time, the computational models only tackled the analysis associated with the back-scattering techniques of ion beam analysis and performed calculation based on a slab analysis. A variety of other programs arose during this time, such as RBSFIT, though due to the lack of in-depth knowledge on ion beam analysis, it became increasingly hard ...

  5. Induced polarization - Wikipedia

    en.wikipedia.org/wiki/Induced_polarization

    Induced polarization is a geophysical method used extensively in mineral exploration and mining operations. Resistivity and IP methods are often applied on the ground surface using multiple four-electrode sites. In an IP survey (and when making resistivity measurements), capacitive properties of the subsurface materials are determined as well.

  6. Photoemission spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Photoemission_spectroscopy

    For solids, photoelectrons can escape only from a depth on the order of nanometers, so that it is the surface layer which is analyzed. Because of the high frequency of the light, and the substantial charge and energy of emitted electrons, photoemission is one of the most sensitive and accurate techniques for measuring the energies and shapes of ...

  7. Secondary ion mass spectrometry - Wikipedia

    en.wikipedia.org/wiki/Secondary_ion_mass...

    Static SIMS is the process involved in surface atomic monolayer analysis, or surface molecular analysis, usually with a pulsed ion beam and a time of flight mass spectrometer, while dynamic SIMS is the process involved in bulk analysis, closely related to the sputtering process, using a DC primary ion beam and a magnetic sector or quadrupole ...

  8. Back-stripping - Wikipedia

    en.wikipedia.org/wiki/Back-stripping

    Using equation ,a complete subsidence analysis is performed by stepwise removal of the top layer at any one stage during the analysis and performing back-stripping as if for a single layer case. For the remaining column, mean densities and thickness must be used at each time, or calculation, step. [ 4 ]

  9. Yates analysis - Wikipedia

    en.wikipedia.org/wiki/Yates_Analysis

    Table of signs to calculate the effect estimates for a 3-level, 2-factor factorial design. Adapted from Berger et al., ch. 9. The full table of signs for a three-factor, two-level design is given to the right. Both the factors (columns) and the treatment combinations (rows) are written in Yates' order.