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  2. Solenoid voltmeter - Wikipedia

    en.wikipedia.org/wiki/Solenoid_voltmeter

    Some manufacturers include a continuity test lamp function in a solenoid meter; these use the same probes as the voltage test function. This feature is useful when testing the status of contacts in energized circuits. The continuity light displays if the contact is closed, and the solenoid voltmeter shows voltage presence if open (and energized).

  3. Megger Group Limited - Wikipedia

    en.wikipedia.org/wiki/Megger_Group_Limited

    Due to electromagnetic interference, the first Megger insulation testers were built as two separate boxes – one for voltage generation, and one for measurement. They were later integrated into a single device in a Bakelite case, with special foldable handle for driving the dynamo. The most popular was the so-called "Wee Megger" (voltage up to ...

  4. Logic probe - Wikipedia

    en.wikipedia.org/wiki/Logic_probe

    While most logic probes are powered by the circuit under test, some devices use batteries. They can be used on either TTL (transistor-transistor logic) or CMOS (complementary metal-oxide semiconductor) logic integrated circuit devices, such as 7400-series, 4000 series, and newer logic families that support similar voltages.

  5. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

  6. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  7. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Many wafers today are still tested one device at a time. If one wafer had 1000 of these devices and the time required to test one device was 10 seconds and the time for the prober to move from one device to another device was 1 second, then to test an entire wafer would take 1000 x 11 seconds = 11,000 seconds or roughly 3 hours.