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X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
In general, an X-ray's beam intensity is not uniform. When it focuses to a target, a conical shape appears (divergent beam). The intensity of the beam from the positive anode side is lower than the intensity from the negative cathode side because the photons created when the electrons strike the target have a longer way to travel through the rotating target on the anode side.
X-ray absorption (left) and differential phase-contrast (right) image of an in-ear headphone obtained with a grating interferometer at 60kVp. Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images.
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
Backscatter X-ray is an advanced X-ray imaging technology. Traditional X-ray machines detect hard and soft materials by the variation in x-ray intensity transmitted through the target. In contrast, backscatter X-ray detects the radiation that reflects from the target. It has potential applications where less-destructive examination is required ...
X-ray ptychography at a small-angle scattering beamline of a synchrotron. This x-ray ptychograph of a zone plate shows the luminosity data in image (a) and the phase data in image (b). Insets I, II and III from (b) are shown in (i), (j) and (k) respectively as processed in 2015; they show a clear improvement in resolution over the algorithms ...
The highest energy X-rays which penetrate the hohlraum can be visualized using an X-ray microscope such as here, where X-radiation is represented in orange/red. In the 1950s Newberry produced a shadow X-ray microscope which placed the specimen between the source and a target plate, this became the basis for the first commercial X-ray ...