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Chroma ATE Inc. 致茂電子, is a Taiwanese electronic test and measurement instrumentation company founded in 1984. The company develops and manufactures a range of electronic test and measurement equipment, automated testing equipment (), signal generator, power supplies, and intelligent manufacturing execution systems ().
By virtue of being programmable, tests like load regulation, battery discharge curve measurement and transient tests can be fully automated and load changes for these tests can be made without introducing switching transient that might change the measurement or operation of the power source under test.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
Testing often requires that the component under test be isolated from the circuit in which they are mounted, as otherwise stray or leakage current paths may distort measurements. In some cases, the voltage from the multimeter may turn active devices on, distorting a measurement, or in extreme cases even damage an element in the circuit being ...
A receptacle tester being used to check for some types of improper wiring of an outlet. For this particular tester, proper wiring is indicated by the two yellow lights. The outlet tester checks that each contact in the outlet appears to be connected to the correct wire in the building's electrical wiring. It can identify several common wiring ...
The alternating magnetic flux set up by the growler passes through the windings of the armature coil, generating an alternating voltage in the coil. A short in the coil creates a closed circuit that will act like the secondary coil of a transformer, with the growler acting like the primary coil.
I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...
Probe cards or DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used. One type of DUT board is used for testing the individual die of a silicon wafer before they are cut free and packaged, and another type is used for testing packaged IC's.