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A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom .
The tip of the instrument is placed with light pressure of 10-20 grams [1] into the gingival sulcus, which is an area of potential space between a tooth and the surrounding tissue. It is important to keep the periodontal probe parallel to the contours of the root of the tooth and to insert the probe down to the base of the pocket. This results ...
SHRIMP II at Research School of Earth Sciences, Australian National University, Australia. The sensitive high-resolution ion microprobe (also sensitive high mass-resolution ion microprobe or SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument that was produced by Australian Scientific Instruments in Canberra, Australia and now has been taken ...
With the probe and surface in contact, a bias applied between the tip and sample will generate capacitance variations between the tip and sample. The capacitance microscopy method developed by Williams et al. used the RCA video disk capacitance sensor connected to the probe to detect the tiny changes in semiconductor surface capacitance ...
The Williams diagram is universal in the sense that it is applicable to both premixed and non-premixed combustion. In supersonic combustion and detonations , the diagram becomes three-dimensional due to the addition of the Mach number M a = u ′ / c {\displaystyle Ma=u'/c} as the z-axis, where c {\displaystyle c} is the sound speed .
This means that V b is equal to -V c, which is the work function difference between the SKP probe and the sample measured. [8] Simplified illustration of the scanning Kelvin probe (SKP) technique. The probe is shown to vibrate in z, perpendicular to the sample plane. The probe and sample form a parallel plate capacitor as shown.
A passive oscilloscope probe with a switch in the probe handle that selects 1× or 10× attenuation. To minimize loading, attenuator probes (e.g., 10× probes) are used. A typical probe uses a 9 megohm series resistor shunted by a low-value capacitor to make an RC compensated divider with the cable capacitance and scope input.
Beams - The three beams on the balance are used to set the level of precision, with each beam working at different increments (generally 1-10 grams, 10 grams and 100 grams). When using the triple beam balance, it is recommended to start with the lowest level of precision (e.g. 100 gram increments) and then work your way down.