When.com Web Search

  1. Ads

    related to: aluminum can fusion flux wire for electrical properties cause

Search results

  1. Results From The WOW.Com Content Network
  2. Gold–aluminium intermetallic - Wikipedia

    en.wikipedia.org/wiki/Gold–aluminium_intermetallic

    Au 5 Al 2 's formation at the joint causes increase of electrical resistance, which can lead to electrical failure. [3] Au 5 Al 2 typically forms at 95% of Au and 5% of Al by mass, its melting point is about 575 °C, which is the lowest among the major gold-aluminum intermetallic compounds.

  3. Flux (metallurgy) - Wikipedia

    en.wikipedia.org/wiki/Flux_(metallurgy)

    Deterioration of electrical properties of printed circuit boards, as soldering temperatures are above the glass transition temperature of the board material and flux components (e.g. glycols, or chloride and bromide ions) can diffuse into its matrix; e.g. water-soluble fluxes containing polyethylene glycol were demonstrated to have such impact [10]

  4. Skin effect - Wikipedia

    en.wikipedia.org/wiki/Skin_effect

    In most cases this is a small portion of a wire's inductance which includes the effect of induction from magnetic fields outside of the wire produced by the current in the wire. Unlike that external inductance, the internal inductance is reduced by skin effect, that is, at frequencies where skin depth is no longer large compared to the ...

  5. Aluminum building wiring - Wikipedia

    en.wikipedia.org/wiki/Aluminum_building_wiring

    The use of larger gauge stranded aluminum wire (larger than #8 AWG) is fairly common in much of North America for modern residential construction. Aluminum wire is used in residential applications for lower voltage service feeders from the utility to the building. This is installed with materials and methods as specified by the local electrical ...

  6. Aluminium - Wikipedia

    en.wikipedia.org/wiki/Aluminium

    Aluminium, although rarely, can cause vitamin D-resistant osteomalacia, erythropoietin-resistant microcytic anemia, and central nervous system alterations. People with kidney insufficiency are especially at a risk. [182]

  7. Electromigration - Wikipedia

    en.wikipedia.org/wiki/Electromigration

    Electromigration can be a cause of degradation in some power semiconductor devices such as low voltage power MOSFETs, in which the lateral current through the source contact metallisation (often aluminium) can reach the critical current densities during overload conditions. The degradation of the aluminium layer causes an increase in on-state ...

  8. Eddy current - Wikipedia

    en.wikipedia.org/wiki/Eddy_current

    A conductive object will experience a repulsion force. This can lift objects against gravity, though with continual power input to replace the energy dissipated by the eddy currents. An example application is separation of aluminum cans from other metals in an eddy current separator. Ferrous metals cling to the magnet, and aluminum (and other ...

  9. Electromagnetic forming - Wikipedia

    en.wikipedia.org/wiki/Electromagnetic_forming

    A pinched aluminium can, produced from a pulsed magnetic field created by rapidly discharging 2 kilojoules from a high-voltage capacitor bank into a 3-turn coil of heavy gauge wire. Electromagnetic forming ( EM forming or magneforming ) is a type of high-velocity, cold forming process for electrically conductive metals, most commonly copper and ...