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The history of X-ray microscopy can be traced back to the early 20th century. After the German physicist Röntgen discovered X-rays in 1895, scientists soon illuminated an object using an X-ray point source and captured the shadow images of the object with a resolution of several micrometers. [2]
Sterling Price Newberry (August 10, 1915 – January 28, 2017) was an American inventor and microscopist.He was born in Springfield, Missouri.Newberry invented the shadow X-ray microscope and was one of the founders of the Microscopy Society of America.
Early X-ray microscopes by Paul Kirkpatrick and Albert Baez used grazing incidence reflective optics to focus the X-rays, which grazed X-rays off parabolic curved mirrors at a very high angle of incidence. An alternative method of focusing X-rays is to use a tiny fresnel zone plate of concentric gold or nickel rings on a silicon dioxide substrate
Antonie van Leeuwenhoek (1632–1723). The field of microscopy (optical microscopy) dates back to at least the 17th-century.Earlier microscopes, single lens magnifying glasses with limited magnification, date at least as far back as the wide spread use of lenses in eyeglasses in the 13th century [2] but more advanced compound microscopes first appeared in Europe around 1620 [3] [4] The ...
X-ray optics is the branch of optics dealing with X-rays, rather than visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction , X-ray crystallography , X-ray fluorescence , small-angle X-ray scattering , X-ray microscopy , X-ray phase-contrast imaging , and X-ray ...
1967: Erwin Wilhelm Müller adds time-of-flight spectroscopy to the field ion microscope, making the first atom probe and allowing the chemical identification of each individual atom. 1981: Gerd Binnig and Heinrich Rohrer develop the scanning tunneling microscope (STM). 1986: Gerd Binnig, Quate, and Gerber invent the atomic force microscope (AFM).
The development of dark-field X-ray microscopy has been driven by the need for non-destructive imaging of bulk crystalline samples at high resolution, and it continues to be an active area of research today. However, dark-field microscopy, [3] [4] dark-field scanning transmission X-ray microscopy, [5] and soft dark-field X-ray microscopy [6 ...
The duplicate of an early TEM on display at the Deutsches Museum in Munich, Germany A transmission electron microscope (1976).. In 1873, Ernst Abbe proposed that the ability to resolve detail in an object was limited approximately by the wavelength of the light used in imaging or a few hundred nanometres for visible light microscopes.