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Bright-field microscopy is the simplest of a range of techniques used for illumination of samples in light microscopes, and its simplicity makes it a popular technique. The typical appearance of a bright-field microscopy image is a dark sample on a bright background, hence the name.
While the dark-field image may first appear to be a negative of the bright-field image, different effects are visible in each. In bright-field microscopy, features are visible where either a shadow is cast on the surface by the incident light or a part of the surface is less reflective, possibly by the presence of pits or scratches.
Bright Field imaging uses the specular, reflected, (0,0) beam to form an image. Also known as phase or interference contrast imaging, bright field imaging makes particular use of the wave nature of the electron to generate vertical diffraction contrast, making steps on the surface visible.
Axial bright-field detectors are located in the centre of the cone of illumination of the transmitted beam, and are often used to provide complementary images to those obtained by ADF imaging. [12] Annular bright-field detectors, located within the cone of illumination of the transmitted beam, have been used to obtain atomic resolution images ...
Since the introduction of the digital camera in the mid-1990s, several new digital phase-imaging methods have been developed, collectively known as quantitative phase-contrast microscopy. These methods digitally create two separate images, an ordinary bright-field image and a so-called phase-shift image.
Setting up weak-beam dark-field imaging in transmission electron microscopy involves several steps, which may vary depending on the specific TEM instrument and the sample being analyzed. This may require further optimization and adjustment to achieve the desired image quality and contrast.
Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. [1] Conventional TEM dark-field imaging uses an objective aperture to
This eliminates a typical weaknesses in conventional STEM operation as STEM bright-field and dark-field detectors are placed at fixed angles and cannot be changed during imaging. [27] With a 4D dataset bright/dark-field images can be obtained by integrating diffraction intensities from diffracted and transmitted beams respectively. [25]