Search results
Results From The WOW.Com Content Network
A semiconductor detector in ionizing radiation detection physics is a device that uses a semiconductor (usually silicon or germanium) to measure the effect of incident charged particles or photons. Semiconductor detectors find broad application for radiation protection, gamma and X-ray spectrometry, and as particle detectors.
An Automated Optical Inspection device. Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew).
Based on device structure, photodetectors can be classified into the following categories: MSM Photodetector: A metal-semiconductor-metal (MSM) photodetector consists of a semiconductor layer sandwiched between two metal electrodes. The metal electrodes are interdigitated, forming a series of alternating fingers or grids.
A detector located the opposite side of the object records an image of the x-rays transmitted through the object. The detector either converts the x-rays first into visible light which is imaged by an optical camera, or detects directly using an x-ray sensor array. The object under inspection may be imaged at higher magnification by moving the ...
The specific detectivity of the device was shown to be comparable to the detectivity of more established detectors at the time, such as QWIPs or HgCdTe detectors. [13] This pioneering work stimulated the search for bi-functional optoelectronic devices embedding both lasing and detection within the same photonic architecture. [14] [15] [16] [17]
Hybrid pixel detectors are a type of ionizing radiation detector consisting of an array of diodes based on semiconductor technology and their associated electronics. The term “hybrid” stems from the fact that the two main elements from which these devices are built, the semiconductor sensor and the readout chip (also known as application-specific integrated circuit or ASIC), are ...
SPADs are semiconductor devices that are based on a p–n junction that is reverse-biased at an operating voltage that exceeds the junction's breakdown voltage (). [3] " At this bias, the electric field is so high [higher than 3×10 5 V/cm] that a single charge carrier injected into the depletion layer can trigger a self-sustaining avalanche.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.