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Non-Contact Optical Profilometer A contact profilometer at LAAS technological facility in Toulouse, France. A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography.
An electrostatic fieldmeter, also called a static meter is a tool used in the static control industry. It is used for non-contact measurement of electrostatic charge on an object. It measures the force between the induced charges in a sensor and the charge present on the surface of an object.
Surface finish may be measured in two ways: contact and non-contact methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers . Non-contact methods include: interferometry , digital holography , confocal microscopy , focus variation , structured light , electrical capacitance ...
Part 602 describes this type of non-contact profilometer, incorporating a single point white light chromatic confocal sensor. The operating principle is based upon the chromatic dispersion of the white light source along the optical axis, via a confocal device, and the detection of the wavelength that is focused on the surface by a spectrometer .
A laser surface velocimeter (LSV) is a non-contact optical speed sensor measuring velocity and length on moving surfaces. Laser surface velocimeters use the laser Doppler principle to evaluate the laser light scattered back from a moving object. They are widely used for process and quality control in industrial production processes.
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MountainsMap Profile 2D Profilometers: ISO 25178 surface texture parameters Roughness, Waviness, Contour analysis MountainsMap Topography [29] 3D Profilometers based on single point sensors [8] (stylus contact, chromatic non-contact) ISO 25178 Surface topography parameters 3D surface topography rendering Sensor range expansion by vertical patching
Capacitively coupled systems that do not require direct physical contact with the soil have also been developed. These systems are capable of tomographic studies as well as mapping horizontal patterning. They may also be used on hard or very dry surfaces that preclude electrical contact necessary for probe resistance systems.
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