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  2. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...

  3. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    A pattern set with 100% stuck-at fault coverage consists of tests to detect every possible stuck-at fault in a circuit. 100% stuck-at fault coverage does not necessarily guarantee high quality, since faults of many other kinds often occur (e.g. bridging faults, opens faults, delay faults).

  4. Iddq testing - Wikipedia

    en.wikipedia.org/wiki/Iddq_testing

    Iddq testing has many advantages: It is a simple and direct test that can identify physical defects. The area and design time overhead are very low. Test generation is fast. Test application time is fast since the vector sets are small. It catches some defects that other tests, particularly stuck-at logic tests, do not.

  5. Fault coverage - Wikipedia

    en.wikipedia.org/wiki/Fault_coverage

    In digital electronics, fault coverage refers to stuck-at fault coverage. [1] It is measured by sticking each pin of the hardware model at logic '0' and logic '1', respectively, and running the test vectors. If at least one of the outputs differs from what is to be expected, the fault is said to be detected.

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  8. Fault model - Wikipedia

    en.wikipedia.org/wiki/Fault_model

    Basic fault models in digital circuits include: Static faults, which give incorrect values at any speed and sensitized by performing only one operation: the stuck-at fault model. A signal, or gate output, is stuck at a 0 or 1 value, independent of the inputs to the circuit. the bridging fault model. Two signals are connected together when they ...

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