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A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
A drive that implements S.M.A.R.T. may optionally implement a number of self-test or maintenance routines, and the results of the tests are kept in the self-test log. The self-test routines may be used to detect any unreadable sectors on the disk, so that they may be restored from back-up sources (for example, from other disks in a RAID). This ...
The goal and objectives, the time frame, the stress test level and the total costs of the stress test are defined. Phase 2: Assessment, during which the stress test at the component and the system scope is performed, including fragility [12] and risk [13] analysis of the CIs for the stressors defined in Phase 1. The stress test can result in ...
Texas Instruments sold its laptop business to Acer in 1997. Toshiba: Japan Dynabook, Libretto, Portégé, Satellite, Satellite Pro, Qosmio, T series, Tecra: Toshiba fully exited the personal computer and laptop business in June 2020, transferring the remaining 19.9 percent shares to Sharp Corporation, which now runs the business as Dynabook Inc ...
Reliability, availability and serviceability (RAS), also known as reliability, availability, and maintainability (RAM), is a computer hardware engineering term involving reliability engineering, high availability, and serviceability design. The phrase was originally used by IBM as a term to describe the robustness of their mainframe computers.
highly accelerated stress test is a Ongoing Reliability Test that uses the empirical operational limits as the reference for the combined vibration, thermal cycling, and other stress applied to find latent defects. Quality of the products is then measured with the results of this test.