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On-board diagnostics (OBD) is a term referring to a vehicle's self-diagnostic and reporting capability. In the United States, this capability is a requirement to comply with federal emissions standards to detect failures that may increase the vehicle tailpipe emissions to more than 150% of the standard to which it was originally certified.
An insulation resistance test (IR test) measures the electrical resistance of insulation by applying a voltage between two locations, and measuring the resultant current flow. Proper safety precautions must be taken when doing this test, such as exclusion zones, making sure no wires are exposed, and personal protective equipment is worn.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
Automatic test equipment, any apparatus that performs tests using automation; Built-in test equipment, passive fault management and diagnosis equipment built into airborne systems to support maintenance; On-board diagnostics, test equipment for automobiles; Transistor tester, used to test the electrical behavior of transistors and solid-state ...
Failure modes, effects, and diagnostic analysis (FMEDA) is a systematic analysis technique to obtain subsystem / device level failure rates, failure modes and diagnostic capability. The FMEDA technique considers: All components of a design, The functionality of each component, The failure modes of each component,
For example, if a fault is detected in hydraulic system 1, then the truth table sends an event to the state chart that the left inner actuator should be turned off. One of the benefits of this model-based FDI technique is that this reactive controller can also be connected to a continuous-time model of the actuator hydraulics, allowing the ...
The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.