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The structure factor is a critical tool in the interpretation of scattering patterns (interference patterns) obtained in X-ray, electron and neutron diffraction experiments. Confusingly, there are two different mathematical expressions in use, both called 'structure factor'.
The Patterson function is used to solve the phase problem in X-ray crystallography. It was introduced in 1935 by Arthur Lindo Patterson while he was a visiting researcher in the laboratory of Bertram Eugene Warren at MIT. [1] [2] The Patterson function is defined as
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Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [2] An instrument dedicated to performing such powder measurements is called a powder diffractometer .
The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.
Pole figure and diffraction figure. Consider the diffraction pattern obtained with a single crystal, on a plane that is perpendicular to the beam, e.g. X-ray diffraction with the Laue method, or electron diffraction in a transmission electron microscope. The diffraction figure shows spots. The position of the spots is determined by the Bragg's ...
Calcium fluoride is a classic example of a crystal with a fluorite structure. Crystallographic information can be collected via x-ray diffraction, providing information on the locations of electron density within a crystal structure. Using modern software such as Olex2, [4] one can solve a crystal structure from crystallographic output files.