Search results
Results From The WOW.Com Content Network
Electrostatic discharge (ESD) is a sudden and momentary flow of electric current between two differently-charged objects when brought close together or when the dielectric between them breaks down, often creating a visible spark associated with the static electricity between the objects.
Reverse bias: Although the LED is based on a diode junction and is nominally a rectifier, the reverse-breakdown mode for some types can occur at very low voltages and essentially any excess reverse bias can cause immediate degradation, and may lead to vastly accelerated failure. 5 V is a typical maximum reverse bias voltage specification for ...
In electrical engineering, transmission-line pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 of Pulse Generators , Vol. 5 of the MIT Radiation Lab Series.
One of the rare toys that actually accomplishes something, the Easy-Bake is heated by a 100-watt light bulb. What could be a more permanent Using Your Easy-Bake Oven Is About to Become Difficult
ESD is treated as a small, localized phenomenon, although technically a lightning flash is a very large ESD event. ESD can also be man-made, as in the shock received from a Van de Graaff generator. An ESD event can damage electronic circuitry by injecting a high-voltage pulse, besides giving people an unpleasant shock. Such an ESD event can ...
Electrical breakdown in an electric discharge showing the ribbon-like plasma filaments from a Tesla coil.. In electronics, electrical breakdown or dielectric breakdown is a process that occurs when an electrically insulating material (a dielectric), subjected to a high enough voltage, suddenly becomes a conductor and current flows through it.
IEC 61000-4-2 is the International Electrotechnical Commission's immunity standard on electrostatic discharge (ESD). The publication is one of the basic EMC standards of the IEC 61000–4 series. The European equivalent of the standard is called EN 61000-4-2. The current version of the IEC standard is the second edition dated 2008-12-09. [1]
A sudden fail-open fault can cause multiple secondary failures if it is fast and the circuit contains an inductance; this causes large voltage spikes, which may exceed 500 volts. A broken metallisation on a chip may thus cause secondary overvoltage damage. [1] Thermal runaway can cause sudden failures including melting, fire or explosions.