Search results
Results From The WOW.Com Content Network
The Infrared Data Association (IrDA) is an industry-driven interest group that was founded in 1994 [1] by around 50 companies. IrDA provides specifications for a complete set of protocols for wireless infrared communications, and the name "IrDA" also refers to that set of protocols.
The IRDA opened up the market in August 2000 with an invitation for registration applications; foreign companies were allowed ownership up to 26 percent. The authority, with the power to frame regulations under Section 114A of the Insurance Act, 1938, has framed regulations ranging from company registrations to the protection of policyholder ...
This is a list of interface bit rates, is a measure of information transfer rates, or digital bandwidth capacity, at which digital interfaces in a computer or network can communicate over various kinds of buses and channels.
To provide the boundary scan capability, IC vendors add additional logic to each of their devices, including scan cells for each of the external traces. These cells are then connected together to form the external boundary scan shift register (BSR), and combined with JTAG Test Access Port (TAP) controller support comprising four (or sometimes more) additional pins plus control circuitry.
Series 32 – Limited Futures Exam - Regulations; Series 37 – Canada Securities Representative Exam - With Options; Series 38 – Canada Securities Representative Exam - No Options; Series 42 – Registered Options Representative Exam; Series 44 – NYSE Arca Options Market Maker Exam; Series 47 – Japanese Module of the General Securities Exam
Li-Fi modules. Li-Fi is a derivative of optical wireless communications (OWC) technology, which uses light from light-emitting diodes (LEDs) as a medium to deliver network, mobile, high-speed communication in a similar manner to Wi-Fi. [4]
Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.
[36] [38] USB 3.2 , released in September 2017, [ 39 ] preserves existing USB 3.1 SuperSpeed and SuperSpeedPlus architectures and protocols and their respective operation modes, but introduces two additional SuperSpeedPlus operation modes ( USB 3.2 Gen 1×2 and USB 3.2 Gen 2×2 ) with the new USB-C Fabric with signaling rates of 10 and 20 Gbit ...