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  2. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Multimeter e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital Multimeter) (Measures all of the above) LCR meter - inductance (L), capacitance (C) and resistance (R) meter (measure LCR values) The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator

  3. List of electrical and electronic measuring equipment

    en.wikipedia.org/wiki/List_of_electrical_and...

    Capacitance meter: Measures the capacitance component Current clamp: Measures current without physical connection Curve tracer: Applies swept signals to a device and allows display of the response Cos Phi Meter: Measures the power factor Distortionmeter: Measures the distortion added to a circuit Electricity meter: Measures the amount of energy ...

  4. Electrical outlet tester - Wikipedia

    en.wikipedia.org/wiki/Electrical_outlet_tester

    A quick supplemental screening test for these simple miswiring errors can be performed using a non-contact voltage tester (NCVT) or non-contact voltage detector. [4] If a problem is thus identified, it can be investigated further using more-advanced equipment, or the outlet in question can be de-energized and disassembled for careful scrutiny. [4]

  5. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.

  6. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes.

  7. Source measure unit - Wikipedia

    en.wikipedia.org/wiki/Source_measure_unit

    An SMU instrument can source and sink power in all four quadrants. SMUs are used for test applications requiring high accuracy, high resolution and measurement flexibility. Such applications include I-V characterizing and testing semiconductors and other non-linear devices and materials, where sourcing voltage and current source span across ...

  8. Multimeter - Wikipedia

    en.wikipedia.org/wiki/Multimeter

    Multimeter test leads. A multimeter can use many different test probes to connect to the circuit or device under test. Crocodile clips, retractable hook clips, and pointed probes are the three most common types. Tweezer probes are used for closely spaced test points, as for instance surface-mount devices. The connectors are attached to flexible ...

  9. Current clamp - Wikipedia

    en.wikipedia.org/wiki/Current_clamp

    An electrical meter with integral AC current clamp is known as a clamp meter, clamp-on ammeter, tong tester, or colloquially as an amp clamp. A clamp meter measures the vector sum of the currents flowing in all the conductors passing through the probe, which depends on the phase relationship of the currents. Only one conductor is normally ...