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A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.
This is an example of dual booting, in which the user chooses which operating system to start after the computer has performed its Power-on self-test (POST). In this example of dual booting, the user chooses by inserting or removing the DVD from the computer, but it is more common to choose which operating system to boot by selecting from a ...
Programmable built-in self-test (pBIST) Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm [2] Logic built-in self-test (LBIST) Analog and mixed-signal built-in self-test (AMBIST) Continuous built-in self-test (CBIST, C-BIT) Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.
The BIOS in older PCs initializes and tests the system hardware components (power-on self-test or POST for short), and loads a boot loader from a mass storage device which then initializes a kernel. In the era of DOS , the BIOS provided BIOS interrupt calls for the keyboard, display, storage, and other input/output (I/O) devices that ...
A drive that implements S.M.A.R.T. may optionally implement a number of self-test or maintenance routines, and the results of the tests are kept in the self-test log. The self-test routines may be used to detect any unreadable sectors on the disk, so that they may be restored from back-up sources (for example, from other disks in a RAID). This ...
At a minimum, if the CPU, BIOS, and the I/O interface upon which the POST card relies on are all working, a POST card can be used to monitor the system's Power-On Self Test (POST), or to diagnose problems with it.
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
For example, Open Firmware is essential for reliably identifying slave I 2 C devices like temperature sensors for hardware monitoring, [4]: §5.1 whereas the alternative solution of performing a blind probe of the I 2 C bus, as has to be done by software like lm_sensors on generic hardware, is known to result in serious hardware issues under ...