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The process capability index, or process capability ratio, is a statistical measure of process capability: the ability of an engineering process to produce an output within specification limits. [1] The concept of process capability only holds meaning for processes that are in a state of statistical control.
Process capability. The process capability is a measurable property of a process to the specification, expressed as a process capability index (e.g., C pk or C pm) or as a process performance index (e.g., P pk or P pm). The output of this measurement is often illustrated by a histogram and calculations that predict how many parts will be ...
Consider a quality characteristic with a target of 100.00 μm and upper and lower specification limits of 106.00 μm and 94.00 μm, respectively. If, after carefully monitoring the process for a while, it appears that the process is out of control and producing output unpredictably (as depicted in the run chart below), one can't meaningfully estimate its mean and standard deviation.
A process capability analysis may be performed on a stable process to predict the ability of the process to produce "conforming product" in the future. A stable process can be demonstrated by a process signature that is free of variances outside of the capability index. A process signature is the plotted points compared with the capability index.
e. Process window index (PWI) is a statistical measure that quantifies the robustness of a manufacturing process, e.g. one which involves heating and cooling, known as a thermal process. In manufacturing industry, PWI values are used to calibrate the heating and cooling of soldering jobs (known as a thermal profile) while baked in a reflow oven.
Control charts, also known as Shewhart charts (after Walter A. Shewhart) or process-behavior charts, are a statistical process control tool used to determine if a manufacturing or business process is in a state of control. It is more appropriate to say that the control charts are the graphical device for Statistical Process Monitoring (SPM).
Defects per million opportunities. In process improvement efforts, defects per million opportunities or DPMO (or nonconformities per million opportunities (NPMO)) is a measure of process performance. It is defined as. A defect can be defined as a nonconformance of a quality characteristic (e.g. strength, width, response time) to its specification.
ISO/IEC 15504 is the reference model for the maturity models (consisting of capability levels which in turn consist of the process attributes and further consist of generic practices) against which the assessors can place the evidence that they collect during their assessment, so that the assessors can give an overall determination of the organization's capabilities for delivering products ...