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A flame ionization detector (FID) is a scientific instrument that measures analytes in a gas stream. It is frequently used as a detector in gas chromatography . The measurement of ions per unit time makes this a mass sensitive instrument. [ 1 ]
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
A DID is an ion detector which uses a high-voltage electric discharge to produce ions. The detector uses an electrical discharge in helium to generate high energy UV photons and metastable helium which ionizes all compounds except helium. [1] The ions produce an electric current, which is the signal output of the detector. The greater the ...
In crystallography, a stacking fault is a planar defect that can occur in crystalline materials. [ 1 ] [ 2 ] Crystalline materials form repeating patterns of layers of atoms. Errors can occur in the sequence of these layers and are known as stacking faults.
An evaporative light scattering detector (ELSD) is a destructive chromatography detector, used in conjunction with high-performance liquid chromatography (HPLC), [1] ultra high-performance liquid chromatography (UHPLC), [2] purification liquid chromatography such as flash or preparative chromatography (using a splitter), countercurrent or ...
Liquid penetrant inspection of non-magnetic aircraft metal parts. Fluorescent penetrant inspection (FPI) is a type of dye penetrant inspection in which a fluorescent dye is applied to the surface of a non-porous material in order to detect defects that may compromise the integrity or quality of the part in question.
In terms of supramolecular chemistry, chemosensing is an example of host–guest chemistry, where the presence of a guest (the analyte) at the host site (the sensor) gives rise to recognition event (e.g. sensing) that can be monitored in real time.
Typical X-ray detectors for electron microscopes cover only a small solid angle, which makes X-ray detection relatively inefficient since X-rays are emitted from the sample in every direction. However, detectors covering large solid angles have been recently developed, [ 27 ] and atomic resolution X-ray mapping has even been achieved.