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  2. Advanced CCD Imaging Spectrometer - Wikipedia

    en.wikipedia.org/wiki/Advanced_CCD_Imaging...

    The Advanced CCD Imaging Spectrometer (ACIS), formerly the AXAF CCD Imaging Spectrometer, is an instrument built by a team from the Massachusetts Institute of Technology's Center for Space Research and the Pennsylvania State University for the Chandra X-ray Observatory.

  3. Thorlabs - Wikipedia

    en.wikipedia.org/wiki/Thorlabs

    Thorlabs, Inc. is an American privately held optical equipment company headquartered in Newton, New Jersey. [2] The company was founded in 1989 by Alex Cable , who serves as its current CEO . His daughter, Jennifer Cable, serves as president. [ 3 ]

  4. White light interferometry - Wikipedia

    en.wikipedia.org/wiki/White_light_interferometry

    A CCD image sensor like those used for digital photography is placed at the point where the two images are superimposed. A broadband “white light” source is used to illuminate the test and reference surfaces. A condenser lens collimates the light from the broadband light source.

  5. Optical spectrometer - Wikipedia

    en.wikipedia.org/wiki/Optical_spectrometer

    An optical spectrometer (spectrophotometer, spectrograph or spectroscope) is an instrument used to measure properties of light over a specific portion of the electromagnetic spectrum, typically used in spectroscopic analysis to identify materials. [1]

  6. Spectroradiometer - Wikipedia

    en.wikipedia.org/wiki/Spectroradiometer

    The integration time should be adjusted for a signal which does not exceed the maximum counts (16-bit CCD has 65,536, 14-bit CCD has 16,384). Saturation occurs when the integration time is set too high. Typically, a peak signal of about 85% of the maximum is a good target and yields a good S/N ratio. (ex: 60K counts or 16K counts respectively)

  7. Ellipsometry - Wikipedia

    en.wikipedia.org/wiki/Ellipsometry

    Ellipsometry can also be done as imaging ellipsometry by using a CCD camera as a detector. This provides a real time contrast image of the sample, which provides information about film thickness and refractive index. Advanced imaging ellipsometer technology operates on the principle of classical null ellipsometry and real-time ellipsometric ...

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