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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
The Circuit Breaker is a design pattern commonly used in software development to improve system resilience and fault tolerance. Circuit breaker pattern can prevent cascading failures particularly in distributed systems. [1] In distributed systems, the Circuit Breaker pattern can be used to monitor service health and can detect failures dynamically.
In electric power systems and industrial automation, ANSI Device Numbers can be used to identify equipment and devices in a system such as relays, circuit breakers, or instruments. The device numbers are enumerated in ANSI / IEEE Standard C37.2 Standard for Electrical Power System Device Function Numbers, Acronyms, and Contact Designations .
Early generator interlock kits consisted of two sliding steel or plastic (depending on the brand) plates held together by three bolts and installed on the front cover of the home's breaker panel, however, some models made by Eaton (formerly Cutler-Hammer) and Siemens for panels manufactured by them install on the adjacent circuit breakers themselves and consist of a sliding arm for breakers ...
Generator switching applications are well known for their higher strains on interrupting devices, such as high fault current of high asymmetry or high and steep transient recovery voltage; the standard IEC/IEEE 62271-37-013 (former and still valid IEEE C37.013, 1997) was introduced to address such requirements on circuit-breakers used in ...
A digital pattern generator is a piece of electronic test equipment or software used to generate digital electronic stimuli. Digital electronics stimuli are a specific kind of electrical waveform varying between two conventional voltages that correspond to two logic states ("low state" and "high state", "0" and "1").