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  2. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Traditionally, an AFM cannot scan images as fast as an SEM, requiring several minutes for a typical scan, while an SEM is capable of scanning at near real-time, although at relatively low quality. The relatively slow rate of scanning during AFM imaging often leads to thermal drift in the image [ 51 ] [ 52 ] [ 53 ] making the AFM less suited for ...

  3. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    nc-AFM was the first form of AFM to achieve true atomic resolution images, rather than averaging over multiple contacts, both on non-reactive and reactive surfaces. [ 32 ] nc-AFM was the first form of microscopy to achieve subatomic resolution images, initially on tip atoms [ 42 ] and later on single iron adatoms on copper.

  4. Conductive atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Conductive_atomic_force...

    Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...

  5. Infrared Nanospectroscopy (AFM-IR) - Wikipedia

    en.wikipedia.org/wiki/Infrared_Nanospectroscopy...

    The high repetition rate of the QCL allows absorbed infrared light to continuously excite the AFM tip at a "contact resonance" [Note 5] of the AFM cantilever. This resonance-enhanced AFM-IR, in combination with electric field enhancement from metallic tips and substrates led to the demonstration of AFM-IR spectroscopy and compositional imaging ...

  6. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    From left to right shows images of increasing magnification where the scale bar in the first image is 50 μm and in the third is 200 nm. The first image shows the substrate, cantilever and the tip whereas the second image shows the tip geometry whilst the last image shows the tip apex and demonstrates the fine point that is achieved e.g. radius ...

  7. Bimodal atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Bimodal_atomic_force...

    In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).

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    www.aol.com/games/play/masque-publishing/just-words

    If you love Scrabble, you'll love the wonderful word game fun of Just Words. Play Just Words free online!

  9. ISO/IEC 19794-5 - Wikipedia

    en.wikipedia.org/wiki/ISO/IEC_19794-5

    ISO/IEC 19794 Information technology—Biometric data interchange formats—Part 5: Face image data, or ISO/IEC 19794-5 for short, is the fifth of 8 parts of the ISO/IEC standard ISO/IEC 19794, published in 2005, which describes interchange formats for several types of biometric data.