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In ionizing radiation detection physics, a semiconductor detector is a device that uses a semiconductor (usually silicon or germanium) to measure the effect of incident charged particles or photons. Semiconductor detectors find broad application for radiation protection , gamma and X-ray spectrometry , and as particle detectors .
Detectors are designed to have one or two scintillation materials, depending on the application. "Single phosphor" detectors are used for either alpha or beta, and "Dual phosphor" detectors are used to detect both. [8] A scintillator such as zinc sulphide is used for alpha particle detection, whilst plastic scintillators are used for beta ...
Summary of particle detector types. Many of the detectors invented and used so far are ionization detectors (of which gaseous ionization detectors and semiconductor detectors are most typical) and scintillation detectors; but other, completely different principles have also been applied, like Čerenkov light and transition radiation.
Semiconductor detectors in which one of more constituent atoms are neutron reactive are called bulk semiconductor neutron detectors. Bulk solid-state neutron detectors can be divided into two basic categories: those that rely on the detection of charged-particle reaction products and those that rely on the detection of prompt capture gamma rays.
Schematic of a solid-state detector. The operating principle of Semiconductor detectors is similar to gas ionization detectors: except that instead of ionization of gas atoms, free electrons and holes are produced which create a signal at the electrodes. The advantage of solid state detectors is the greater resolution of the resultant energy ...
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
Radiation detection. 1 language. Suomi; Edit links. Article; ... Ionization chambers; ... Semiconductor detectors This page was last edited on 28 January 2020, at 03: ...
Due to the large variation in ionization probabilities among elements sputtered from different materials, comparison against well-calibrated standards is necessary to achieve accurate quantitative results. SIMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion.