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A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.
Download QR code; Print/export Download as PDF; Printable version; In other projects ... a POST card can be used to monitor the system's Power-On Self Test ...
Download as PDF; Printable version; ... Key Code Qualifier is an error-code returned by a SCSI device. ... power-on or self-test failure x: 4C: 00:
This program runs a power-on self-test (POST) to check and initialize required devices such as main memory , the PCI bus and the PCI devices (including running embedded Option ROMs). One of the most involved steps is setting up DRAM over SPD, further complicated by the fact that at this point memory is very limited.
FPGAs, and PLAs allow POST (and BIOS) to exist as hardware. Before either one existed state machines existed in hardware. Most implemented a power-on self test -- imagine trying to debug one of these things without knowing if the machine was able to provide reliable debug information. Kernel.package 23:37, 30 September 2010 (UTC)
On an IBM mainframe, a power-on reset (POR) is a sequence of actions that the processor performs either due to a POR request from the operator or as part of turning on power. The operator requests a POR for configuration changes that cannot be recognized by a simple System Reset .
The vulnerability exists when the Driver Execution Environment (DXE) is active after a successful Power On Self Test (POST) in the UEFI firmware (also known as the BIOS). ). The UEFI's boot logo is replaced with the exploit payload at this point, and the exploit can then take control of the sys
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.