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  2. Profilometer - Wikipedia

    en.wikipedia.org/wiki/Profilometer

    An optical profilometer is a non-contact method for providing much of the same information as a stylus based profilometer. There are many different techniques which are currently being employed, such as laser triangulation ( triangulation sensor ), confocal microscopy (used for profiling very small objects), coherence scanning interferometry ...

  3. Veeco - Wikipedia

    en.wikipedia.org/wiki/Veeco

    Veeco Instruments Inc. is a global capital equipment supplier, headquartered in the U.S., that designs and builds processing systems used in semiconductor and compound semiconductor manufacturing, data storage and scientific markets for applications such as advanced packaging, photonics, power electronics and display technologies.

  4. White light scanner - Wikipedia

    en.wikipedia.org/wiki/White_light_scanner

    Figure 3. White light interferometric microscope. White-light interferometry scanning (WLS) systems capture intensity data at a series of positions along the vertical axis, determining where the surface is located by using the shape of the white-light interferogram, the localized phase of the interferogram, or a combination of both shape and phase.

  5. Korean Photonics Technology Institute (KOPTI) Purchases Veeco ...

    www.aol.com/news/2013-01-15-korean-photonics...

    PLAINVIEW, N.Y.--(BUSINESS WIRE)-- Veeco Instruments Inc. (NAS: VECO) announced today that the Korean Photonics Technology Institute (KOPTI) has purchased a GEN20™ Molecular Beam Epitaxy system ...

  6. NANEO Precision IBS Coatings GmbH Expands Manufacturing ... - AOL

    www.aol.com/2013/02/15/naneo-precision-ibs...

    NANEO Precision IBS Coatings GmbH Expands Manufacturing Capacity with Veeco IBD System PLAINVIEW, N.Y.--(BUSINESS WIRE)-- Veeco Instruments Inc. (NAS: VECO) announced today that NANEO Precision ...

  7. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    The disadvantage of a profilometer is that it is not accurate when the size of the features of the surface are close to the same size as the stylus. Another disadvantage is that profilometers have difficulty detecting flaws of the same general size as the roughness of the surface. [1] There are also limitations for non-contact instruments.

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