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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    M. von Ardenne's. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

  3. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  4. Electron channelling contrast imaging - Wikipedia

    en.wikipedia.org/wiki/Electron_channelling...

    Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps. Unlike the use of transmission electron microscopy (TEM) for ...

  5. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted ...

  6. Convergent beam electron diffraction - Wikipedia

    en.wikipedia.org/wiki/Convergent_beam_electron...

    Convergent beam electron diffraction. Convergent beam electron diffraction (CBED) is an electron diffraction technique where a convergent or divergent beam (conical electron beam) of electrons is used to study materials. CBED scheme, adapted from W. Kossel and G. Möllenstedt, Elektroneninterferenzen im konvergenten Bündel, Annalen der Physik ...

  7. Precession electron diffraction - Wikipedia

    en.wikipedia.org/wiki/Precession_electron...

    Precession electron diffraction is accomplished utilizing the standard instrument configuration of a modern TEM. The animation illustrates the geometry used to generate a PED pattern. Specifically, the beam tilt coils located pre-specimen are used to tilt the electron beam off of the optic axis so it is incident with the specimen at an angle, φ.

  8. Cathode-ray tube - Wikipedia

    en.wikipedia.org/wiki/Cathode-ray_tube

    The only visible differences are the single electron gun, the uniform white phosphor coating, and the lack of a shadow mask. A cathode-ray tube (CRT) is a vacuum tube containing one or more electron guns, which emit electron beams that are manipulated to display images on a phosphorescent screen. [ 2 ]

  9. Kikuchi lines (physics) - Wikipedia

    en.wikipedia.org/wiki/Kikuchi_lines_(physics)

    Kikuchi lines (physics) Kikuchi lines are patterns of electrons formed by scattering. They pair up to form bands in electron diffraction from single crystal specimens, there to serve as "roads in orientation-space" for microscopists uncertain of what they are looking at. In transmission electron microscopes, they are easily seen in diffraction ...