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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Many recent advances have expanded the list of applications for PFM and further increased this powerful technique. Indeed what started as a user modified AFM has now attracted the attention of the major SPM manufacturers so much so that in fact many now supply ‘ready-made’ systems specifically for PFM each with novel features for research.
Bruker Releases AFM Zoom Option for 3D Optical Microscopes NanoLens™ Accessory Expands Power of ContourGT Systems BOSTON--(BUSINESS WIRE)-- Bruker announced today at the 2012 Materials Research ...
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Bruker Introduces New AFM Semiconductor Characterization Solution Highest Resolution Carrier Profiling Capability Confirmed by Imec SANTA BARBARA, Calif.--(BUSINESS WIRE)-- Bruker announced today ...
UK National Graphene Institute Selects Bruker's Dimension FastScan AFM New Levels of Speed, Ease of Use, and Productivity Enable Next-Generation Applications SANTA BARBARA, Calif.--(BUSINESS WIRE ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
This type of AFM operation is referred to as the force mode. With this probe, one can study interactions between various surfaces and probe particles in the sphere-plane geometry . It is also possible to study forces between colloidal particles by attaching another particle to the substrate and perform the measurement in the sphere-sphere ...
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