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The Java Device Test Suite has approximately 11,000 tests that can be extended with new tests written by Sun engineers or by others, including users of the test suite. Users can choose to run any combination of tests, according to the features supported by a device and available resources, and make use of framework features:
Mobile-device testing functions to assure the quality of mobile devices, like mobile phones, PDAs, etc. It is conducted on both hardware and software, and from the view of different procedures, the testing comprises R&D testing, factory testing and certificate testing.
The installation of a JVM or Java interpreter on chips, devices, or software packages became an industry standard practice. The catch is that since there are multiple JVM implementations, on top of a wide variety of different operating systems, there could be subtle differences in how a program executes on each JVM/OS combination, possibly ...
The first test of the upgraded equipment came six weeks before the Super Bowl when the Superdome hosted the New Orleans Bowl on December 22, 2012. ... Supovitz’s mantra while managing the Super ...
Abbreviated Test Language for All Systems (ATLAS) is a specialized programming language for use with automatic test equipment (ATE). It is a compiled high-level computer language and can be used on any computer whose supporting software can translate it into the appropriate low-level instructions .
Test-driven development (TDD) is a way of writing code that involves writing an automated unit-level test case that fails, then writing just enough code to make the test pass, then refactoring both the test code and the production code, then repeating with another new test case.
The purpose of the PTCRB is to provide the framework within which device certification can take place for members of the PTCRB. [1] This includes, but is not limited to, determination of the test specifications and methods necessary to support the certification process for 5G NR and 4G LTE wireless devices.
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...