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The success of the phase-contrast microscope has led to a number of subsequent phase-imaging methods. In 1952, Georges Nomarski patented what is today known as differential interference contrast (DIC) microscopy. [8] It enhances contrast by creating artificial shadows, as if the object is illuminated from the side.
Micrasterias furcata imaged in transmitted DIC microscopy Laser-induced optical damage in LiNbO 3 under 150× Nomarski microscopy. Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples.
X-ray absorption (left) and differential phase-contrast (right) image of an in-ear headphone obtained with a grating interferometer at 60kVp. Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images.
The advantages of these methods compared to normal absorption-contrast X-ray imaging is higher contrast for low-absorbing materials (because phase shift is a different mechanism than absorption) and a contrast-to-noise relationship that increases with spatial frequency (because many phase-contrast techniques detect the first or second ...
Conventional phase contrast microscopy and related methods, such as differential interference contrast microscopy, visualize phase shifts by transforming phase shift gradients into intensity variations. These intensity variations are mixed with other intensity variations, making it difficult to extract quantitative information.
[20] [21] Quantitative phase-contrast microscopy has an advantage over fluorescent and phase-contrast microscopy in that it is both non-invasive and quantitative in its nature. Due to the narrow focal depth of conventional microscopy, live-cell imaging is to a large extent currently limited to observing cells on a single plane.
Differential interference contrast (DIC) provides modest improvements to optical sectioning. In DIC the sample is effectively illuminated by two slightly offset light sources which then interfere to produce an image resulting from the phase differences of the two sources. As the offset in the light sources is small the only difference in phase ...
4 DIC vs Phase Contrast, and AVEC-DIC. 1 comment. 5 Image: The route of light througn a DIC microscope. 3 comments. 6 Picture. 2 comments.