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  2. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    It is a magnetically balanced coil that measures current by electronically evaluating the line integral around a current. High-frequency, small-signal, passive current probes typically have a frequency range of several kilohertz to over 100 MHz. The Tektronix P6022 has a range from 935 Hz to 200 MHz. (Tektronix 1983, p. 435)

  3. Rogowski coil - Wikipedia

    en.wikipedia.org/wiki/Rogowski_coil

    The picture shows a Rogowski coil encircling a current-carrying cable. The output of the coil, v(t), is connected to a lossy integrator circuit to obtain a voltage V out (t) that is proportional to I(t). A Rogowski coil, named after Walter Rogowski, is an electrical device for measuring alternating current (AC) or high

  4. Bead probe technology - Wikipedia

    en.wikipedia.org/wiki/Bead_probe_technology

    Bead probe technology is a probing method used to connect electronic test equipment to the device under test (DUT) within a bed of nails fixture. The technique was first used in the 1990s [ 3 ] and originally given the name “Waygood Bump” after one of the main proponents, Rex Waygood.

  5. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging is complete [3] since the probe pads are typically on the perimeter of the IC, the IC can soon become pad-limited.

  6. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]

  7. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...