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The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...
Polymer characterization is the analytical branch of polymer science. The discipline is concerned with the characterization of polymeric materials on a variety of levels. The characterization typically has as a goal to improve the performance of the material.
Dynamic mechanical analysis (abbreviated DMA) is a technique used to study and characterize materials.It is most useful for studying the viscoelastic behavior of polymers.A sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus.
Besides material characterization, the material scientist or engineer also deals with extracting materials and converting them into useful forms. Thus ingot casting, foundry methods, blast furnace extraction, and electrolytic extraction are all part of the required knowledge of a materials engineer.
Solid-state chemistry, also sometimes referred as materials chemistry, is the study of the synthesis, structure, and properties of solid phase materials.It therefore has a strong overlap with solid-state physics, mineralogy, crystallography, ceramics, metallurgy, thermodynamics, materials science and electronics with a focus on the synthesis of novel materials and their characterization.
Consequently, the rolling process is often followed by a heat treatment to reduce the amount of unwanted texture. Controlling the production process in combination with the characterization of texture and the material's microstructure help to determine the materials properties, i.e. the processing-microstructure-texture-property relationship.
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Materials Science and Engineering – An Introduction. London: John Wiley and Sons. ISBN 0-471-32013-7. Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press. ISBN 978-0-521-83199-4