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Electron tomography is an extension of traditional transmission electron microscopy and uses a transmission electron microscope to collect the data. In the process, a beam of electrons is passed through the sample at incremental degrees of rotation around the center of the target sample.
In contrast to other electron tomography techniques, samples are imaged under cryogenic conditions (< −150 °C). For cellular material, the structure is immobilized in non-crystalline, vitreous ice, allowing them to be imaged without dehydration or chemical fixation, which would otherwise disrupt or distort biological structures. [3] [4]
Transmission electron micrograph of dislocations in steel, which are faults in the structure of the crystal lattice at the atomic scale Samples can exhibit diffraction contrast, whereby the electron beam undergoes diffraction which in the case of a crystalline sample, disperses electrons into discrete locations in the back focal plane .
Electron beam computed tomography (EBCT) is a fifth generation computed tomography (CT) scanner in which the X-ray tube is not mechanically spun in order to rotate the source of X-ray photons. This different design was explicitly developed to better image heart structures that never stop moving, performing a complete cycle of movement with each ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
EFTEM – Energy filtered transmission electron microscopy; EID – Electron induced desorption; EIT and ERT – Electrical impedance tomography and electrical resistivity tomography; EL – Electroluminescence; Electron crystallography; ELS – Electrophoretic light scattering; ENDOR – Electron nuclear double resonance, see ESR or EPR
Charge coupled device (CCD) cameras were first applied to transmission electron microscopy in the 1980s and later became widespread. [3] [4] For use in a TEM, CCDs are typically coupled with a scintillator such as single crystal Yttrium aluminium garnet (YAG) in which electrons from the electron beam are converted to photons, which are then transferred to the sensor of the CCD via a fiber ...
The E-T secondary electron detector can be used in the SEM's back-scattered electron mode by either turning off the Faraday cage or by applying a negative voltage to the Faraday cage. However, better back-scattered electron images come from dedicated BSE detectors rather than from using the E–T detector as a BSE detector.