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Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
Asmec GmbH :Zwick Roell Group took over Asmec in 2011. Suppliers of materials and component testing systems ASMEC GmbH are based in Radeberg, Germany. ACMEL Labo : a member of the Zwick/Roell Group since 2002, it develops a range of devices for testing cement and mortar. GTM Testing and Metrology GmbH : A manufacturer of load cells, torque ...
PDF/UA (PDF/Universal Accessibility), [1] formally ISO 14289, is an International Organization for Standardization (ISO) standard for accessible PDF technology. A technical specification intended for developers implementing PDF writing and processing software, PDF/UA provides definitive terms and requirements for accessibility in PDF documents and applications. [2]
A universal testing machine (Hegewald & Peschke) The most common testing machine used in tensile testing is the universal testing machine. This type of machine has two crossheads; one is adjusted for the length of the specimen and the other is driven to apply tension to the test specimen. Testing machines are either electromechanical or ...
Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.
Then, a periodic test will assure that the device has not become unsafe since the POST. Safety-critical devices normally define a "safety interval", a period of time too short for injury to occur. The self test of the most critical functions normally is completed at least once per safety interval. The periodic test is normally a subset of the POST.
A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...
To provide the boundary scan capability, IC vendors add additional logic to each of their devices, including scan cells for each of the external traces. These cells are then connected together to form the external boundary scan shift register (BSR), and combined with JTAG Test Access Port (TAP) controller support comprising four (or sometimes more) additional pins plus control circuitry.