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Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
Asmec GmbH :Zwick Roell Group took over Asmec in 2011. Suppliers of materials and component testing systems ASMEC GmbH are based in Radeberg, Germany. ACMEL Labo : a member of the Zwick/Roell Group since 2002, it develops a range of devices for testing cement and mortar. GTM Testing and Metrology GmbH : A manufacturer of load cells, torque ...
Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.
Tensile testing, also known as tension testing, [1] is a fundamental materials science and engineering test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength , breaking strength , maximum elongation and reduction in area. [ 2 ]
A measurement system analysis (MSA) is a thorough assessment of a measurement process, and typically includes a specially designed experiment that seeks to identify the components of variation in that measurement process. Just as processes that produce a product may vary, the process of obtaining measurements and data may also have variation ...
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit (IC).Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
Test drivers and test stubs are both instrumental in software testing, but they serve distinct roles within a test harness. Test drivers are typically an active component and control or call the system under test without further inputs after they are initialised, stubs on the other hand are usually passive components that only receive data and ...