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  2. Training, validation, and test data sets - Wikipedia

    en.wikipedia.org/wiki/Training,_validation,_and...

    A test data set is a data set that is independent of the training data set, but that follows the same probability distribution as the training data set. If a model fit to the training data set also fits the test data set well, minimal overfitting has taken place (see figure below). A better fitting of the training data set as opposed to the ...

  3. Torch (machine learning) - Wikipedia

    en.wikipedia.org/wiki/Torch_(machine_learning)

    The core package of Torch is torch. It provides a flexible N-dimensional array or Tensor, which supports basic routines for indexing, slicing, transposing, type-casting, resizing, sharing storage and cloning. This object is used by most other packages and thus forms the core object of the library.

  4. API testing - Wikipedia

    en.wikipedia.org/wiki/Api_testing

    API testing is a type of software testing that involves testing application programming interfaces (APIs) directly and as part of integration testing to determine if they meet expectations for functionality, reliability, performance, and security. [1] Since APIs lack a GUI, API testing is performed at the message layer. [2]

  5. PyTorch - Wikipedia

    en.wikipedia.org/wiki/PyTorch

    In September 2022, Meta announced that PyTorch would be governed by the independent PyTorch Foundation, a newly created subsidiary of the Linux Foundation. [ 24 ] PyTorch 2.0 was released on 15 March 2023, introducing TorchDynamo , a Python-level compiler that makes code run up to 2x faster, along with significant improvements in training and ...

  6. Kernel method - Wikipedia

    en.wikipedia.org/wiki/Kernel_method

    For many algorithms that solve these tasks, the data in raw representation have to be explicitly transformed into feature vector representations via a user-specified feature map: in contrast, kernel methods require only a user-specified kernel, i.e., a similarity function over all pairs of data points computed using inner products.

  7. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  8. Three-point flexural test - Wikipedia

    en.wikipedia.org/wiki/Three-point_flexural_test

    1940s flexural test machinery working on a sample of concrete Test fixture on universal testing machine for three-point flex test. The three-point bending flexural test provides values for the modulus of elasticity in bending, flexural stress, flexural strain and the flexural stress–strain response of the material.

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