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Measuring the tip-to-sample distance at each (x,y) data point allows the scanning software to construct a topographic image of the sample surface. Non-contact mode AFM does not suffer from tip or sample degradation effects that are sometimes observed after taking numerous scans with contact AFM.
nc-AFM was the first form of AFM to achieve true atomic resolution images, rather than averaging over multiple contacts, both on non-reactive and reactive surfaces. [32] nc-AFM was the first form of microscopy to achieve subatomic resolution images, initially on tip atoms [42] and later on single iron adatoms on copper.
The Kelvin probe force microscope or Kelvin force microscope (KFM) is based on an AFM set-up and the determination of the work function is based on the measurement of the electrostatic forces between the small AFM tip and the sample. The conducting tip and the sample are characterized by (in general) different work functions, which represent ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
The tip itself does not have any working principle for imaging, but depending on the instrumentation, mode of application, and the nature of the sample under investigation, the probe's tip may follow different principles to image the surface of the sample. For example, when a tip is integrated with STM, it measures the tunneling current that ...
Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. In materials science, chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.
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The interaction of the tip with the sample modifies the amplitudes, phase shifts and frequency resonances of the excited modes. Those changes are detected and processed by the feedback of the instrument. Several features make bimodal AFM a very powerful surface characterization method at the nanoscale. (i) Resolution.