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A programmable load is a type of test equipment or instrument which emulates DC or AC resistance loads normally required to perform functional tests of batteries, ...
Chroma ATE Inc. 致茂電子, is a Taiwanese electronic test and measurement instrumentation company founded in 1984. The company develops and manufactures a range of electronic test and measurement equipment, automated testing equipment (), signal generator, power supplies, and intelligent manufacturing execution systems ().
The Standard Commands for Programmable Instruments (SCPI; often pronounced "skippy") defines a standard for syntax and commands to use in controlling programmable test and measurement devices, such as automatic test equipment and electronic test equipment. [3]
A load bank is a piece of electrical test equipment used to simulate an electrical load, to test an electric power source without connecting it to its normal operating load. [ 1 ] [ 2 ] During testing, adjustment, calibration, or verification procedures, a load bank is connected to the output of a power source, such as an electric generator ...
An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
A receptacle tester being used to check for some types of improper wiring of an outlet. For this particular tester, proper wiring is indicated by the two yellow lights. The outlet tester checks that each contact in the outlet appears to be connected to the correct wire in the building's electrical wiring. It can identify several common wiring ...
A dummy load is a device used to simulate an electrical load, usually for testing purposes. In radio a dummy antenna is connected to the output of a radio transmitter and electrically simulates an antenna , to allow the transmitter to be adjusted and tested without radiating radio waves .
I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...