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  2. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    A pattern set with 100% stuck-at fault coverage consists of tests to detect every possible stuck-at fault in a circuit. 100% stuck-at fault coverage does not necessarily guarantee high quality, since faults of many other kinds often occur (e.g. bridging faults, opens faults, delay faults).

  3. Transient recovery voltage - Wikipedia

    en.wikipedia.org/wiki/Transient_Recovery_Voltage

    A terminal fault is a fault that occurs at the circuit breaker terminals. The circuit breaker interrupts a short-circuit at current zero, at this instant the supply voltage is maximum and the recovery voltage tends to reach the supply voltage with a high frequency transient. The normalized value of the overshoot or amplitude factor is 1.4.

  4. Environmental stress screening - Wikipedia

    en.wikipedia.org/wiki/Environmental_stress_screening

    Environmental stress screening (ESS) refers to the process of exposing a newly manufactured or repaired product or component (typically electronic) to stresses such as thermal cycling and vibration in order to force latent defects to manifest themselves by permanent or catastrophic failure during the screening process.

  5. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  6. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.

  7. Snell & Wilcox Zone Plate - Wikipedia

    en.wikipedia.org/wiki/Snell_&_Wilcox_Zone_Plate

    Snell & Wilcox SW2 and SW4 "Zone Plate" Test Chart (also referred to as Snell & Wilcox Test Pattern) were TV test cards introduced in the 1990s and used with NTSC, PAL and SDTV systems. [1] Popular versions of the test charts were made available on Laserdisc and DVD-Video, allowing home users and professionals to test and calibrate their equipment.

  8. Single point of failure - Wikipedia

    en.wikipedia.org/wiki/Single_point_of_failure

    A fault-tolerant computer system can be achieved at the internal component level, at the system level (multiple machines), or site level (replication).. One would normally deploy a load balancer to ensure high availability for a server cluster at the system level. [3]

  9. SMPTE color bars - Wikipedia

    en.wikipedia.org/wiki/SMPTE_color_bars

    SMPTE color bars are a television test pattern used where the NTSC video standard is utilized, including countries in North America. The Society of Motion Picture and Television Engineers (SMPTE) refers to the pattern as Engineering Guideline (EG) 1-1990. [1] Its components are a known standard, and created by test pattern generators.