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Burst errors include those due to disc material (defects of aluminum reflecting film, poor reflective index of transparent disc material), disc production (faults during disc forming and disc cutting etc.), disc handling (scratches – generally thin, radial and orthogonal to direction of recording) and variations in play-back mechanism.
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
In this example, we shall encode 14 bits of message with a 3-bit CRC, with a polynomial x 3 + x + 1. The polynomial is written in binary as the coefficients; a 3rd-degree polynomial has 4 coefficients (1x 3 + 0x 2 + 1x + 1). In this case, the coefficients are 1, 0, 1 and 1.
The construction of a failure detector is an essential, but a very difficult problem that occurred in the development of the fault-tolerant component in a distributed computer system. As a result, the failure detector was invented because of the need for detecting errors in the massive information transaction in distributed computing systems.
a contention-free quadratic permutation polynomial (QPP). [26] An example of use is in the 3GPP Long Term Evolution mobile telecommunication standard. [27] In multi-carrier communication systems, interleaving across carriers may be employed to provide frequency diversity, e.g., to mitigate frequency-selective fading or narrowband interference. [28]
A checksum of a message is a modular arithmetic sum of message code words of a fixed word length (e.g., byte values). The sum may be negated by means of a ones'-complement operation prior to transmission to detect unintentional all-zero messages.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Sometimes a timeshift (delay) is set between systems, which increases the detection probability of errors induced by external influences (e.g. voltage spikes, ionizing radiation, or in situ reverse engineering).