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  2. Fluke Corporation - Wikipedia

    en.wikipedia.org/wiki/Fluke_Corporation

    Together, the companies developed the scopemeter, an instrument combining features of an oscilloscope and a multimeter. Fluke purchased the testing and measurements division of Philips in 1993 for $41.8 million. [2] The Philips PM series of measurement instruments was rebranded as Fluke. Fluke was bought by the Danaher Corporation in 1998.

  3. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.

  4. Multimeter - Wikipedia

    en.wikipedia.org/wiki/Multimeter

    Analog multimeter Digital multimeter. A multimeter (also known as a volt-ohm-milliammeter, volt-ohmmeter or VOM) [1] is a measuring instrument that can measure multiple electrical properties. [2] [3] A typical multimeter can measure voltage, resistance, and current, [4] in which case can be used as a voltmeter, ohmmeter, and ammeter.

  5. Fluke - Wikipedia

    en.wikipedia.org/wiki/Fluke

    Fluke, a 1977 novel by English horror writer James Herbert Fluke, or, I Know Why the Winged Whale Sings , a 2003 novel by Christopher Moore Fluke Mini-Comics & Zine Festival , a one-day mini-comics, small press, and 'zine festival held annually in Athens, Georgia

  6. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Multimeter e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital Multimeter) (Measures all of the above) LCR meter - inductance (L), capacitance (C) and resistance (R) meter (measure LCR values) The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator

  7. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.