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  2. 100 Gigabit Ethernet - Wikipedia

    en.wikipedia.org/wiki/100_Gigabit_Ethernet

    The copper cable objective is met with 4 or 10 differential lanes using SFF-8642 and SFF-8436 connectors. The 10 and 40 km 100 Gbit/s objectives with four wavelengths (around 1310 nm) of 25 Gbit/s optics (100GBASE-LR4 and 100GBASE-ER4) and the 10 km 40 Gbit/s objective with four wavelengths (around 1310 nm) of 10 Gbit/s optics (40GBASE-LR4). [97]

  3. Megger Group Limited - Wikipedia

    en.wikipedia.org/wiki/Megger_Group_Limited

    [10] [11] The modern version of Megger – model MJ15 – can generate up to 5 kV. [12] In the 1920s, the company employed approximately 500 people. That number rose to 1,000 during the Second World War, reaching its peak of 1,870 in 1967. [13] In 1965, Evershed & Vignoles Ltd. became a part of the George Kent Group. [14]

  4. Fluke Corporation - Wikipedia

    en.wikipedia.org/wiki/Fluke_Corporation

    Fluke Corporation is an American manufacturer of industrial test, measurement, and diagnostic equipment, including electronic test equipment. It was started in 1948 by John Fluke while he was employed at General Electric .

  5. Time-domain reflectometer - Wikipedia

    en.wikipedia.org/wiki/Time-domain_reflectometer

    It is only after this round-trip delay that the short can be detected by the TDR. With knowledge of the signal propagation speed in the particular cable-under-test, the distance to the short can be measured. A similar effect occurs if the far end of the cable is an open circuit (terminated into an infinite impedance).

  6. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  7. Dielectric withstand test - Wikipedia

    en.wikipedia.org/wiki/Dielectric_withstand_test

    In electrical engineering, a dielectric withstand test (also pressure test, high potential test, hipot test, or insulation test) is an electrical safety test performed on a component or product to determine the effectiveness of its insulation. The test may be between mutually insulated sections of a part, or energized parts and ground.

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