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  2. On-board diagnostics - Wikipedia

    en.wikipedia.org/wiki/On-board_diagnostics

    On-board diagnostics (OBD) is a term referring to a vehicle's self-diagnostic and reporting capability. In the United States, this capability is a requirement to comply with federal emissions standards to detect failures that may increase the vehicle tailpipe emissions to more than 150% of the standard to which it was originally certified.

  3. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  4. Test equipment - Wikipedia

    en.wikipedia.org/wiki/Test_equipment

    Automatic test equipment, any apparatus that performs tests using automation; Built-in test equipment, passive fault management and diagnosis equipment built into airborne systems to support maintenance; On-board diagnostics, test equipment for automobiles; Transistor tester, used to test the electrical behavior of transistors and solid-state ...

  5. Built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Built-in_self-test

    A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: high reliability; lower repair cycle times; or constraints such as: limited technician accessibility; cost of testing during manufacture

  6. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment . The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

  7. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    The diagnostic portion can be the most difficult and costly portion of the test. It is typical for ATE to reduce a failure to a cluster or ambiguity group of components. One method to help reduce these ambiguity groups is the addition of analog signature analysis testing to the ATE system. Diagnostics are often aided by the use of flying probe ...

  8. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    DFT affects and depends on the methods used for test development, test application, and diagnostics. Most tool-supported DFT practiced in the industry today, at least for digital circuits, is predicated on a Structural test paradigm. Structural test makes no direct attempt to determine if the overall functionality of the circuit is correct.

  9. Power-off testing - Wikipedia

    en.wikipedia.org/wiki/Power-off_testing

    When the PCA can be further damaged by applying power it is necessary to use power off test techniques to safely examine it. Power off testing includes analog signature analysis, ohmmeter, LCR Meter and optical inspection. This type of testing also lends itself well to troubleshooting circuit boards without the aid of supporting documentation ...