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  2. List of piezoelectric materials - Wikipedia

    en.wikipedia.org/wiki/List_of_piezoelectric...

    piezoelectric voltage constant~0.079 Vm/N Bending using a tungsten probe d = 10 Wang et al. 2007 [91] BaTiO 3 - d 33 = 45 pC/N Direct tensile test d ~ 280 Jeong et al. 2014 [92] Alkaline niobate (KNLN) film d 33 = 310 pC/N - Park et al. 2010 [93] BaTiO 3: Thin film d 33 = 190 pC/N Stoppel et al. 2011 [94] AlN Thin film d 33 =5 pC/N AFM Lee et ...

  3. Lithium niobate - Wikipedia

    en.wikipedia.org/wiki/Lithium_niobate

    Lithium niobate (Li Nb O 3) is a synthetic salt consisting of niobium, lithium, and oxygen.Its single crystals are an important material for optical waveguides, mobile phones, piezoelectric sensors, optical modulators and various other linear and non-linear optical applications. [6]

  4. Piezoelectric microelectromechanical systems - Wikipedia

    en.wikipedia.org/wiki/Piezoelectric_micro...

    The additive approach: The piezoelectric thin films are deposited on silicon substrates with layers of insulating and conducting material followed by surface or silicon bulk micromachining. The subtractive approach: Single crystal or polycrystalline piezoelectrics and piezoceramics are subjected to direct bulk micromachining and then electrodes.

  5. KYOCERA Develops Ultra-Thin, Lightweight 'Piezo Film ... - AOL

    www.aol.com/2013/08/29/kyocera-develops-ultra...

    KYOCERA Develops Ultra-Thin, Lightweight 'Piezo Film Speaker' for TVs, PCs, Tablets High audio quality "Smart Sonic Sound" utilized in flat-screen TV for first time KYOTO, Japan--(BUSINESS WIRE ...

  6. Thin-film bulk acoustic resonator - Wikipedia

    en.wikipedia.org/wiki/Thin-film_bulk_acoustic...

    A thin-film bulk acoustic resonator (FBAR or TFBAR) is a device consisting of a piezoelectric material manufactured by thin film methods between two conductive – typically metallic – electrodes and acoustically isolated from the surrounding medium.

  7. Refractive index and extinction coefficient of thin film ...

    en.wikipedia.org/wiki/Refractive_index_and...

    The challenge of characterizing thin films involves extracting t, n(λ) and k(λ) of the film from the measurement of R(λ) and/or T(λ). This can be achieved by combining the Forouhi–Bloomer dispersion equations for n ( λ ) and k ( λ ) with the Fresnel equations for the reflection and transmission of light at an interface [ 21 ] to obtain ...

  8. Thin film - Wikipedia

    en.wikipedia.org/wiki/Thin_film

    A thin film is a layer of materials ranging from fractions of a nanometer to several micrometers in thickness. [1] The controlled synthesis of materials as thin films (a process referred to as deposition) is a fundamental step in many applications.

  9. Polyvinylidene fluoride - Wikipedia

    en.wikipedia.org/wiki/Polyvinylidene_fluoride

    Processed materials are typically in the non-piezoelectric alpha phase. The material must either be stretched or annealed to obtain the piezoelectric beta phase. The exception to this is for PVDF thin films (thickness in the order of micrometres). Residual stresses between thin films and the substrates on which they are processed are great ...